by maneet@allfriends.studio | Jun 30, 2019 | Inspection, Lang - EN, Metrology
In the precise world of high volume manufacturing (HVM), microns and milliseconds matter when inspecting medical staples, fitness trackers and smartphones to meet either government regulations or consumer standards. The need for 100% inspection of parts is driving the... 
by maneet@allfriends.studio | Jun 30, 2019 | Inspection, Metrology
Understanding the features of a non-contact metrology platform versus a traditional contact coordinate measuring machine (CMM) can help manufacturers choose the right equipment for inspection. By investing in the right inspection technology, manufacturers can improve... 
by maneet@allfriends.studio | Jun 30, 2019 | Inspection, Lang - EN, Metrology
In surface morphology inspection, non-contact optical methodologies provide the same measurement results as a conventional contact profiler, but in a fraction of time. Surface finish quality matters in many industries, especially when consumer health and costly... 
by maneet@allfriends.studio | Jun 30, 2019 | Lang - EN, Metrology
Automated metrology platforms not only ensure high quality finished goods, these high speed solutions also lower total cost per part by consolidating multiple metrology operations into one system. High volume part manufacturers often have diverse process flows, and... 
by maneet@allfriends.studio | Jun 30, 2019 | Inspection, Lang - EN, Metrology
When high volume manufacturers need 100% inspection of parts, non-contact metrology stage design should not only maximize sensor use, but also easily measure different parts on the same system. Whether it’s ensuring smartphones perform to meet customer satisfaction or... 
by maneet@allfriends.studio | Jun 30, 2019 | Lang - EN, Metrology
Tightening dimensions are a trend both for components and for an increasing number of parts and devices. Incorrect part dimensional measurements can lead to failure and costly recalls. Small consumer products pack an enormous amount of technology into tiny units. In...