Advanced Metrology Platform for High Volume Inspection
Automated, high-speed inspection system ideal for small parts manufacturing.
High-Speed Multisensor System for Metrology and Inspection
Designed for 100% inspection in high-volume manufacturing, the AMP 3100 non-contact metrology platform features a cutting-edge machine vision system, lasers, custom lighting, advanced robotics, defect detection capabilities, and flexible part-loading options.
With processing speeds exceeding four parts per second, the AMP 3100 metrology platform is a repeatable, high-speed solution offering consistent measurements equal to, or better than, gauge capabilities of Coordinate Measuring Machines (CMMs) and Optical Measuring Machines (OMMs), but with increased throughput to enable 100% measurement of your high-volume parts.
Optimized Optics and Lighting
Non-contact sensors use application-specific, multispectral lighting to scan 3D part profiles at high speed, precisely measuring the most intricate parts at micron levels and with low GRR.
Using a dual-carriage system, two component-handling robots process parts through the metrology zone, maximizing sensor utilization for high-speed output, while a custom nest ensures precise placement, increasing gauge capability without marring the part surface.
Data Driven Efficiency Insights
Manufacturers can analyze real-time data and perform effective root-cause analyses to adjust and improve upstream and downstream processes. Statistical process control data can drive warning to reduce variablity and scrap.
Features & Benefits
- Captures dimensional and angular measurements, and 3D profiles, with low GRR
- Performs high-speed, cosmetic defect inspection
- Multisensor system performs simultaneous measurements, including color and gloss
- Generates SPC data for process optimization and MES integration
- Decreases manufacturing and inspection costs per part
- Highly configurable, application-specific platform:
- 3D lasers and high-resolution cameras
- Multispectral lighting
- Fixturing and material handling
200 x 20 x 10 mm (L x W x H)
X-axis: 0.7 to 1.0 m active (±1μm repeatability)
Y-axis: Per requirements (±1μm repeatability)
Z-axis: Per requirements (±1μm repeatability)
236 x 99 x 204 cm (W x D x H)
2,187 kg (4,820 lbs)
- Flexible input and output options (tray, conveyor, bin, and process module interface)
- Binning options
- Pre- and post-metrology assembly and processing options, including adhesives, coatings, and laser marking
High-performance industrial PC operator station with touch screen and secondary display screen
Benefits of Consolidating Metrology Operations
Automated metrology platforms not only ensure high quality finished goods, these high speed solutions also lower total cost per part by consolidating multiple metrology operations into one system.
Improving Long-Term Performance of Metrology Systems
In challenging manufacturing environments, adjustability, calibration, and monitoring are key influences on the long-term performance of automated metrology systems installed in uncontrolled environments.
Speed Wins in Contact vs. Non-Contact Surface Profiling
In surface morphology inspection, non-contact optical methodologies provide the same measurement results as a conventional contact profiler—but in a fraction of time.
With manufacturing facilities located in the U.S. and China, DWFritz provides exceptional global support services.